Study of metrological properties of QHE samples

Project Description

The aim of this project is to test the metrological properties of samples produced by the Institute of Physics (IOP) of the Czech Academy of Sciences and to compare them to samples produced by the Laboratoire d'Electronique de Philips, at various temperatures.

DC measurements will be performed at BNM-LCIE: measurement of the contact resistances, of the longitudinal resistance, quantum Hall resistances comparison through a 100 ohm transfer resistance at 4.2 K, 1.2 K (and, depending on the previous results, at lower temperatures).

AC measurements will be performed at the joint laboratory of the Czech Technical University Prague (CTU), of the IOP and of the Czech Metrological Institute (CMI): determination of the frequency dependence of the two types of samples for plateaus i=2 and i=4, using calculable resistors fabricated by the CTU.



Electricity and Magnetism (EM)
Jérome Blanchet, BNM-LCIE (France)
Further Partners