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Find all EURAMET Metrology Research Projects

TYPE
FIELD
PROJECT NUMBER
SHORT NAME
TITLE
SHORT DESCRIPTION
COORDINATOR
STATUS
CALL
EMRP Environment ENV01 MACPoll Metrology for Chemical Pollutants in Air Supporting the development of EU air quality policies: Improving indoor and outdoor air quality measurements Annarita Baldan completed 2010
EMRP SI Broader Scope SIB56 SoundPwr Realisation, dissemination and application of the unit watt in airborne sound The airborne watt: New measurements of sound power  Volker Wittstock completed 2012
EMRP Energy ENG05 Lighting Metrology for Solid State Lighting The future of lighting: Enabling the uptake of low energy Solid State Lighting (SSL) Marijn van Veghel completed 2009
EMRP SI Broader Scope SIB52 Thermo Metrology for thermal protection materials Thermal protection for industry: Building confidence in novel thermal protection materials Jiyu Wu completed 2012
EMRP Open Excellence EXL02 SIQUTE Single-photon sources for quantum technologies Tools for calibrating optical quantum devices Stefan Kück completed 2012
EMRP Open Excellence EXL04 SpinCal Spintronics and spin-caloritronics in magnetic nanosystems Tools for measuring properties of quantum electron spin Hans Werner Schumacher completed 2012
EMRP Open Excellence EXL03 MICROPHOTON Measurement and control of single-photon microwave radiation on a chip Tools for microwave single photon measurements Antti Manninen completed 2012
EMPIR SI Broader Scope 18SIB05 ROCIT Robust Optical Clocks for International Timescales Tools to correct for systematic frequency shifts and enable automated validation supporting redefinition of the SI second Helen Margolis completed 2018
EMRP SI Broader Scope SIB08 subnano Traceability of sub-nm length measurements Traceability of sub-nm length measurements Birk Andreas completed 2011
EMPIR Industry 20IND11 MetHyInfra Metrology infrastructure for high-pressure gas and liquified hydrogen flows Traceable measurements to deliver market confidence and consumer acceptance of hydrogen as an energy source Hans-Benjamin Böckler in progress 2020
EMPIR SI Broader Scope 17SIP06 FAME VNA Traceable, Faster More Accurate Measurement Software for Vector Network Analysers Traceable, Faster and More Accurate Measurement Software for Vector Network Analysers completed 2017
EMPIR Energy 19ENG02 FutureEnergy Metrology for future energy transmission Ultra-high voltage grids transmit electricity more efficiently than current networks but require new methodologies Alf-Peter Elg in progress 2019
EMRP Industry IND15 SurfChem Traceable quantitative surface chemical analysis for industrial applications Understanding chemical reactions at surfaces: Improving the speed and efficiency of industrial processes completed 2010
EMPIR Fundamental 20FUN02 POLight Pushing boundaries of nano-dimensional metrology by light Unlocking innovation opportunities in identified Key Enabling Technologies Bernd Bodermann in progress 2020
EMRP Industry IND17 Scatterometry Metrology of small structures for the manufacturing of electronic and optical devices Using scatterometry to measure small structures: Supporting the miniaturisation of technological components Bernd Bodermann completed 2010
EMPIR Health 18HLT07 MedalCare Metrology of automated data analysis for cardiac arrhythmia management Validating software for automatic diagnoses of cardiovascular diseases Markus Bär completed 2018
EMRP Environment ENV56 KEY-VOCs Metrology for VOC indicators in air pollution and climate change Volatile Organic Compounds: Supporting air quality monitoring networks with new measurements of VOCs Annarita Baldan completed 2013
EMPIR Energy 19ENG08 WindEFCY Traceable mechanical and electrical power measurement for efficiency determination of wind turbines Wind power is the largest form of renewable energy, but current testing methods are hindering innovations Rolf Kumme in progress 2019
iMERA-Plus Length T3.J1.4 NANOTRACE New Traceability Routes for Nanometrology Dimensional measurements play a crucial role in almost every aspect of modern life where the role of nanotechnologies in Information and Communication Technology is growing. Today laser interferometers are the essential tool for metrology in semiconductor manufacturing where they are used for pattern placement measurements on photomasks and for position control in wafer scanners. The accuracy demands of dimensional measurements are rapidly growing. Marco Pisani completed 2007
iMERA-Plus Length T3.J1.1 Nanoparticles Traceable Characterisation of Nanoparticles Ever since the development of nanoparticles in the late 1960's and early 1970's they have been known to act as a bridge between atomic structures and bulk properties. This means they have potentially unique properties, for example as highly concentrated suspensions in the ink industry as drug delivery agents for the pharmaceutical industry, and in novel composite materials. Additional toxicological concerns require strict and well defined standards to be applied. completed 2007
428 result(s)