Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies

Short Name: TEMMT, Project Number: 18SIB09
5G schematic

Improving confidence in parameters for emerging high frequency communications and electronic technologies

Future transformative technologies such as connected and autonomous vehicles will likely depend on 5G networks, cellular IoT and other digital devices operating at very high frequencies. Development is hampered, however, by a lack of traceability to the SI for some key electrical parameters. Traceability is not available for power meters; extender heads and calibration kits for vector network analysers to measure S-parameters (that quantifies loss and phase change for transmitted and reflected signals); and material characterisation kits for measuring complex material properties.


The project will establish traceability to the SI for measuring S-parameter, power and complex permittivity of dielectric materials, at terahertz frequencies. Traceability and verification techniques will be developed, contributions made to international standards bodies, and developments promoted to NMIs – to facilitate coordinated measurement capabilities. Exploiting this part of the spectrum will result in improved product quality and end-user confidence in the communications and electronics industries, and competitive advantage for European Industry.

Project website
Characterization of a Thermal Isolation Section of a Waveguide Microcalorimeter

IEEE Transactions on Instrumentation and Measurement

Anomalies in multiline-TRL-corrected measurements of short CPW lines

2021 96th ARFTG Microwave Measurement Conference (ARFTG)

Impact of Chuck Boundary Conditions on Wideband On-Wafer Measurements

2021 IEEE 25th Workshop on Signal and Power Integrity (SPI)

Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies

Journal of Infrared, Millimeter, and Terahertz Waves

Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width

2020 IEEE 24th Workshop on Signal and Power Integrity (SPI)

VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating

2020 Conference on Precision Electromagnetic Measurements (CPEM)

Automated Contacting of On-Wafer Devices for RF Testing

2020 Conference on Precision Electromagnetic Measurements (CPEM)

Comparison of Waveguide and Free-Space Power Measurement in the Millimeter-Wave Range

2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

Other Participants
Anritsu Emea Limited (United Kingdom)
Chalmers tekniska hoegskola AB (Sweden)
Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik (Germany)
FormFactor GmbH (Germany)
Forschungsverbund Berlin e.V. (Germany)
Instituto Nacional de Tecnología Industrial (Argentina)
Keysight Technologies Belgium (Belgium)
Rohde & Schwarz GmbH & Co. Kommanditgesellschaft (Germany)
The University of Birmingham (United Kingdom)
Université de Lille (France)
Virginia Diodes, Inc. (United States)
Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego (Poland)