Supporting emerging technologies through improved moisture-control materials
This Support for Impact (SIP) project builds on the improved measurement techniques for water vapour transmission rates (WVTR) of barrier materials developed in EMRP project Thin Films. These measurement techniques for WVTR are important for high-value technologies, from electronic displays to solar cells, where the barrier materials are used to protect electronic devices from exposure to moisture which can damage performance.
Prior to this project, there was a need for the measurement techniques developed in the Thin Films project to be made available to organisations beyond the metrology community.
This project therefore incorporated the work of the Thin Films project into standardisation, and supported uptake by European industry. This project has also contributed to the development of traceable measurement WVTR facilities that will enable industry to test innovative thin film materials, commercial instrumentation and electronic devices.