Microwave measurements for planar circuits and components
Short Name: PlanarCal, Project Number: 14IND02
Reliable measurements of microwave signals produced by on-wafer radio communications devices
The innovative potential of Europe’s consumer electronics, medical diagnostics, automotive, and telecoms industries has been held back by inaccurate methods available for measuring and specifying characteristics of an important enabling integrated circuit technology. Low-power ‘on-wafer’ radio communications capabilities are starting to be developed for various mobile communication devices, but these chips suffer unwanted effects due to various types of stray, or ‘parasitic’, emissions of microwave signals. Such effects become most pronounced at higher frequencies and lower signal power. The unreliability and inaccuracy of available signal measurement methods reduced market confidence in the value of device development and amplified the costs of chip fabrication.
This project developed traceable measurement and characterisation methods applicable to planar (flat) integrated circuits and components that use microwave radio frequencies, to known measurement uncertainties. As a worldwide first, traceability was demonstrated for on-wafer S-parameter (signal scattering parameter) measurements, not only for devices with built-in membrane technology but also for conventional thin-film substrates, as used in industrial applications (fused silica). Second, METAS developed the VNATools software to provide suitable measurement and uncertainty calculations. Third, guidelines for the design of calibration substrates were developed. Fourth, new instrumentation was developed to address the on-wafer measurement of nano-devices in the microwave regime.
A Best Practice Guide summarising these findings was published as Guidelines for the design of calibration substrates, including the suppression of parasitic modes for frequencies up to and including 325 GHz; and Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers.
The process of offering a calibration service for traceable on-wafer measurements was initiated at PTB, and the first steps towards an Institute of Electrical and Electronics Engineers (IEEE) standard for on-wafer microwave measurements were made.
These outcomes enable manufacturers of planar microwave circuits and components to offer products with defensible specifications, for the first time supported by traceable on-wafer signal measurement. These methods will help increase the efficiency of mobile communication systems and reduce unwanted electromagnetic radiation emissions. The result will be faster and cheaper development of mobile communication applications, and enhanced potential for innovative solutions to be produced in this high-value European industrial sector.
2019 12th German Microwave Conference (GeMiC)
IEEE Transactions on Microwave Theory and Techniques
2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi)
2018 91st ARFTG Microwave Measurement Conference (ARFTG)
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
2018 48th European Microwave Conference (EuMC)
IEEE Transactions on Microwave Theory and Techniques
2018 48th European Microwave Conference (EuMC)
2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)
2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)
IEEE Transactions on Microwave Theory and Techniques
IEEE Microwave and Wireless Components Letters
ARFTG Microwave Measurement Symposium (ARFTG), 2017 Nov 28th - Dec 1st
2018 IEEE/MTT-S International Microwave Symposium - IMS
2017 47th European Microwave Conference (EuMC)
2017 89th ARFTG Microwave Measurement Conference (ARFTG)
ARMMS RF & Microwave Society Conference, 13-14 Nov, 2017, Wyboston, Bedfordshire
2017 90th ARFTG Microwave Measurement Symposium (ARFTG)
2017 89th ARFTG Microwave Measurement Conference (ARFTG)
2017 90th ARFTG Microwave Measurement Symposium (ARFTG)
IEEE Transactions on Microwave Theory and Techniques
2017 47th European Microwave Conference (EuMC)
Microwave Measurement Conference (ARFTG), 2016 87th ARFTG
CPEM 2016, Conference on Precision Electromagnetic Measurements: conference digest: (2016)
2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) Conference Proceedings