Microwave measurements for planar circuits and components

Short Name: PlanarCal, Project Number: 14IND02
Circuit Board - Space
Coordinator

Microwave measurements for high-frequency microchips


High-frequency microchips (or integrated circuits) are in widespread use and are a key enabling technology in systems that employ micro- and nano-electronics such as mobile communications and radar sensors in driverless cars. Increasing demands for higher data rates, and the development of high-resolution radar imaging, are continually pushing up the operating frequency of these systems. Accurate and traceable measurements of such high-frequency integrated circuits are essential for system developments, providing confidence and lowering costs in industry. However, the uncertainties associated with currently available measurement procedures become more pronounced at high frequencies. This project will enable the traceable measurement and characterisation of integrated circuits and components from radio-frequency to sub-mm frequencies with known measurement uncertainties. This will allow industry to develop components and devices in high-speed and microwave applications, such as wireless communications, automotive radar and medical sensing.

Project website
Publications
Influence of Microwave Probes on Calibrated On-Wafer Measurements
2019

IEEE Transactions on Microwave Theory and Techniques

On-Wafer Residual Error Correction Through Adaptive Filtering of Verification Line Measurements
2019

2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi)

Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz
2018

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES

Noise Behavior and Implementation of Interferometer-Based Broadband VNA
2018

IEEE Transactions on Microwave Theory and Techniques

Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band
2018

2018 48th European Microwave Conference (EuMC)

Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards
2018

2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)

Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy
2018

2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)

110 GHz on-wafer measurement comparison on alumina substrate
2018

ARFTG Microwave Measurement Symposium (ARFTG), 2017 Nov 28th - Dec 1st

Effects Degrading Accuracy of CPW mTRL Calibration at W Band
2018

2018 IEEE/MTT-S International Microwave Symposium - IMS

Impact of parasitic coupling on multiline TRL calibration
2017

2017 47th European Microwave Conference (EuMC)

VNA tools II: Calibrations involving eigenvalue problems
2017

2017 89th ARFTG Microwave Measurement Conference (ARFTG)

'Mind the Gap'... Establishing Measurement Capability in the Terahertz Gap Region - from 0.1 THz to 1.1 THz
2017

ARMMS RF & Microwave Society Conference, 13-14 Nov, 2017, Wyboston, Bedfordshire

Mutual interference in calibration line configurations
2017

2017 89th ARFTG Microwave Measurement Conference (ARFTG)

RF wafer probing with improved contact repeatability using nanometer positioning
2016

Microwave Measurement Conference (ARFTG), 2016 87th ARFTG

Comparison between time- and frequency-domain high-frequency device characterizations
2016

CPEM 2016, Conference on Precision Electromagnetic Measurements: conference digest: (2016)

Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods
2016

2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) Conference Proceedings

Other Participants
Forschungsverbund Berlin e.V. (Germany)
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. (Germany)
Friedrich-Alexander-Universität Erlangen - Nürnberg (Germany)
RF360 Europe GmbH (Germany)
Rohde & Schwarz GmbH & Co. Kommanditgesellschaft (Germany)
Technische Universiteit Delft (Netherlands)
Université de Lille (France)
University of Leeds (United Kingdom)