Please type a search term (at least two characters)
Find all EURAMET Metrology Research Projects
TYPE | FIELD | PROJECT NUMBER | SHORT NAME | TITLE | SHORT DESCRIPTION | COORDINATOR | STATUS | CALL |
---|---|---|---|---|---|---|---|---|
EMPIR | Industry | 14IND01 | 3DMetChemIT | Advanced 3D chemical metrology for innovative technologies | Advanced 3D chemical measurements for high-value manufacturing | Rasmus Havelund | completed | 2014 |
EMPIR | Industry | 14IND02 | PlanarCal | Microwave measurements for planar circuits and components | Microwave measurements for high-frequency microchips | Uwe Arz | completed | 2014 |
EMPIR | Industry | 14IND03 | Strength-ABLE | Metrology for length-scale engineering of materials | Supporting length-scale engineering for lighter, stronger materials | Mark Gee | completed | 2014 |
EMPIR | Industry | 14IND04 | EMPRESS | Enhancing process efficiency through improved temperature measurement | Improving temperature measurement capability in high-value manufacturing | Jonathan Pearce | completed | 2014 |
EMPIR | Industry | 14IND05 | MIQC2 | Optical metrology for quantum enhanced secure telecommunication | Optical metrology for quantum-enhanced telecommunications | Ivo Pietro Degiovanni | completed | 2014 |
EMPIR | Industry | 14IND06 | pres2vac | Industrial standards in the intermediate pressure-to-vacuum range | New industrial standards in the intermediate pressure range | Wladimir Sabuga | completed | 2014 |
EMPIR | Industry | 14IND07 | 3D Stack | Metrology for manufacturing 3D stacked integrated circuits | Measurement techniques for manufacturing 3D integrated circuits | Djamel Allal | completed | 2014 |
EMPIR | Industry | 14IND08 | ElPow | Metrology for the electrical power industry | Extending test methods for the electrical power industry | Anders Bergman | completed | 2014 |
EMPIR | Industry | 14IND09 | MetHPM | Metrology for highly-parallel manufacturing | Measuring large-scale, fine-feature printed electronics | Christopher Jones | completed | 2014 |
EMPIR | Industry | 14IND10 | MET5G | Metrology for 5G communications | Developing metrology for 5G communications | Tian Hong Loh | completed | 2014 |
EMPIR | Industry | 14IND11 | HIT | Metrology for humidity at high temperatures and transient conditions | Humidity measurements at high temperatures and transient conditions | Maija Ojanen-Saloranta | completed | 2014 |
EMPIR | Industry | 14IND12 | Innanopart | Metrology for innovative nanoparticles | Measuring nanoparticle concentration and chemistry | Alex Shard | completed | 2014 |
EMPIR | Industry | 14IND13 | PhotInd | Metrology for the photonics industry - optical fibres, waveguides and applications | Improved metrology for the photonics industry | Antti Lassila | completed | 2014 |
EMPIR | Industry | 14IND14 | MNm Torque | Torque measurement in the MN•m range | Traceable torque measurements for improved turbine testing | Rolf Kumme | completed | 2014 |
EMPIR | Research Potential | 14RPT01 | ACQ-PRO | Towards the propagation of ac quantum voltage standards | Supporting industry through increased access to AC quantum voltage references | Javier Díaz de Aguilar | completed | 2014 |
EMPIR | Research Potential | 14RPT02 | AWICal | Traceable calibration of automatic weighing instruments operating in the dynamic mode | New calibration methods to support dynamic weight measurements | Matej Grum | completed | 2014 |
EMPIR | Research Potential | 14RPT03 | ENVCRM | Matrix reference materials for environmental analysis | Improving pollution monitoring with new reference materials | Alper Isleyen | completed | 2014 |
EMPIR | Research Potential | 14RPT04 | Absorb | Absorbed dose in water and air | New calibration services for improved radiotherapy treatment | Jean Marc Bordy | completed | 2014 |
EMPIR | Research Potential | 14RPT05 | Eura-Thermal | Developing traceable capabilities in thermal metrology | Increasing knowledge and facilities for more efficient industrial processes | Jean-Remy Filtz | completed | 2014 |
EMPIR | Industry | 14SIP01 | Vacuum ISO | Technical Specifications for quadrupole mass spectrometers and outgassing rates for assessing the quality of vacuum environments | New standards to improve processes in the semiconductor industry | Karl Jousten | completed | 2014 |
309 result(s)