Find all EURAMET Metrology Research Projects

EMRP New Technologies NEW01 TReND Traceable characterisation of nanostructured devices Characterising nano-layered structures Alice Harling completed 2011
EMRP New Technologies NEW02 Raman Metrology for Raman Spectroscopy Reliable imaging at the nanoscale Alice Harling completed 2011
EMRP New Technologies NEW03 Nano ChOp Chemical and optical characterisation of nanomaterials in biological systems Nanomaterials in biological environments Heidi Goenaga-Infante completed 2011
EMRP New Technologies NEW04 Uncertainty Novel mathematical and statistical approaches to uncertainty evaluation New approaches to complex risk assessment measurements Markus Bär completed 2011
EMRP New Technologies NEW05 MechProNO Traceable measurement of mechanical properties of nano-objects Determining nano-scale material properties Uwe Brand completed 2011
EMRP New Technologies NEW06 TraCIM Traceability for computationally-intensive metrology Improving confidence in new software Alistair Forbes completed 2011
EMRP New Technologies NEW07 THz Security Microwave and terahertz metrology for homeland security Microwave and terahertz security scanning Thomas Kleine-Ostmann completed 2011
EMRP New Technologies NEW08 MetNEMS Metrology with/for NEMS Characterising graphene for nano-devices Ling Hao completed 2011
EMRP New Technologies NEW09 METCO Metrology of electrothermal coupling for new functional materials technology Reliable measurments for functional materials: Efficiency in transport, power generation and solid state cooling completed 2011
EMRP Health HLT08 INFECT-MET Metrology for monitoring infectious diseases, antimicrobial resistance, and harmful micro-organisms Detecting and monitoring infectious disease: Improving disease management Carole Foy completed 2011
EMRP Industry IND01 HiTeMS High temperature metrology for industrial applications (>1000 °C) Making high temperature measurements: Reducing energy use through accurate temperature measurement Graham Machin completed 2010
EMRP Industry IND02 EMINDA Electromagnetic characterisation of materials for industrial applications up to microwave frequencies Advancing the European electronics industry: Measuring high-speed electronics Bob Clarke completed 2010
EMRP Industry IND03 HighPRES High pressure metrology for industrial applications Improving high pressure measurements: High-pressure measurements for industry Wladimir Sabuga completed 2010
EMRP Industry IND04 MetroMetal Ionising radiation metrology for the metallurgical industry Measuring radiation in scrap metals: Preventing the spread of radiation in European steel Eduardo García-Toraño completed 2010
EMRP Industry IND05 MeProVisc Dynamic Mechanical Properties and Long-term Deformation Behaviour of Viscous Materials Enabling polymer use in industry: Improving confidence in polymer properties completed 2010
EMRP Industry IND06 MIQC Metrology for industrial quantum communication technologies Improving data security with quantum technology: Guaranteeing the security of sensitive data Maria Luisa Rastello completed 2010
EMRP Industry IND07 Thin Films Metrology for the manufacturing of thin films Enabling the development of thin film technology: Helping thin film technologies become a reality Fernando Araujo de Castro completed 2010
EMRP Industry IND08 MetMags Metrology for Advanced Industrial Magnetics Developing novel magnetic materials: Improving high-resolution electronic measurements Hans Werner Schumacher completed 2010
EMRP Industry IND09 Dynamic Traceable Dynamic Measurement of Mechanical Quantities Advancing the infrastructure for dynamic measurements: Ensuring reliable measurements of dynamic force, torque and pressure Thomas Bruns completed 2010
EMRP Industry IND10 Form Optical and tactile metrology for absolute form characterisation Measuring optical curved surfaces: Characterising free-form 3D surfaces Michael Schulz completed 2010
346 result(s)