Selected Research Topics (SRTs) for EMRP Call 2012 - Industry

SRT NumberSRT TitleResult
SRT-i01Traceable stability measurement of protein pharmaceuticalsNot funded
SRT-i02Chemical metrology tools for manufacture of advanced biomaterials in the medical device industryFunded as IND56
SRT-i03Metrology for long lifetime flexible large area electronicsNot funded
SRT-i04Large volume metrology in industryFunded as IND53
SRT-i05Traceable in-process dimensional measurementFunded as IND62
SRT-i06Traceable Critical Dimension metrology of engineered nanodevicesNot funded
SRT-i07Metrology for movement and positioning in six degrees of freedomFunded as IND58
SRT-i08Multi-sensor metrology for microparts in innovative industrial productsFunded as IND59
SRT-i09Sustainable electrical machines and devices with reduced rare earth contentNot funded
SRT-i10Improved EMC test methods in industrial environmentsFunded as IND60
SRT-i11Metrology for optical and RF communication systemsFunded as IND51
SRT-i12Metrology for industrial flow meteringNot funded
SRT-i13Metrology for processing materials with high natural radioactivityFunded as IND57
SRT-i14Development of novel non-destructive evaluation techniques and procedures for defect detection in composite structuresNot funded
SRT-i15Metrology to enable high temperature erosion testingFunded as IND61
SRT-i16Novel electronic devices based on control of strain at the nanoscaleFunded as IND54
SRT-i17Metrology for airborne molecular contamination in manufacturing environmentsFunded as IND63
SRT-i18Metrology to support bioprocessing quality-by-designNot funded
SRT-i19Nanoscale probing of transport across interfacesNot funded
SRT-i20Sustainable components through combining plasticity size effectsNot funded
SRT-i21Multidimensional reflectometry for industryFunded as IND52
SRT-i22Wavefont metrology for the characterisation of optical systems in industryNot funded
SRT-i23Metrology for surface waves and surface state-assisted devicesNot funded
SRT-i24Compact microwave clocks for industrial applicationsFunded as IND55

Selected Research Topics (SRTs) for EMRP Call 2012 - SI Broader Scope

SRT NumberSRT TitleResult
SRT-s01Realisation, dissemination and application of the unit watt in airborne soundFunded as SIB56
SRT-s02Optical standards for the traceable characterisation of dynamic pressure fieldsNot funded
SRT-s03Quantum resistance metrology based on grapheneFunded as SIB51
SRT-s04Traceable metrology for high frequency power in the millimetre-wave rangeNot funded
SRT-s05A quantum standard for sampled electrical measurementsFunded as SIB59
SRT-s06Metrology for new electrical measurement quantities in high-frequency circuitsFunded as SIB62
SRT-s07Automated impedance metrology extending the quantum toolbox for electricityFunded as SIB53
SRT-s08Traceability of gas flow measurements for special applicationsNot funded
SRT-s09Metrology for long distance surveyingFunded as SIB60
SRT-s10Angle metrologyFunded as SIB58
SRT-s11Optical bidirectional measurementsNot funded
SRT-s12Crystalline and self-assembled structures as length standardsFunded as SIB61
SRT-s13Outgassing rate control and pascal realisation in the extremely low-pressure rangeNot funded
SRT-s14Force traceability within the meganewton rangeFunded as SIB63
SRT-s15Traceable small force metrologyNot funded
SRT-s16Metrology for organic chemical calibratorsNot funded
SRT-s17Traceability for biologically relevant molecules and entitiesFunded as SIB54
SRT-s18Traceable camera-based photometry and radiometryNot funded
SRT-s19New primary standards and traceability for radiometryFunded as SIB57
SRT-s20International timescales with optical clocksFunded as SIB55
SRT-s21Metrology for thermal protection materialsFunded as SIB52
SRT-s22Thermophysical metrology at the micro and nano scaleNot funded
SRT-s23Metrology for moisture in materialsFunded as SIB64

Selected Research Topics (SRTs) for EMRP Call 2012 - Open Excellence

SRT NumberSRT TitleResult
SRT-x1Spintronics and spin-caloritronics in magnetic nanosystemsFunded as EXL04
SRT-x2Solid-state single quantum particle metrologyNot funded
SRT-x3Measurement and control of single-photon microwave radiation on a chipFunded as EXL03
SRT-x4Nanoscale magnetic detection close to the quantum limitNot funded
SRT-x5Quantum optomechanics and quantum enhanced ultra-high precision measurementsNot funded
SRT-x6Quantum engineered states for optical clocks and atomic sensorsFunded as EXL01
SRT-x7Single-photon sources for quantum technologiesFunded as EXL02
SRT-x8Advanced microscopy for multiparametric molecular imagingNot funded