Selected Research Topics (SRTs) for EMRP Call 2012 - Industry

SRT Number SRT Title Result
SRT-i01 Traceable stability measurement of protein pharmaceuticals Not funded
SRT-i02 Chemical metrology tools for manufacture of advanced biomaterials in the medical device industry Funded as IND56
SRT-i03 Metrology for long lifetime flexible large area electronics Not funded
SRT-i04 Large volume metrology in industry Funded as IND53
SRT-i05 Traceable in-process dimensional measurement Funded as IND62
SRT-i06 Traceable Critical Dimension metrology of engineered nanodevices Not funded
SRT-i07 Metrology for movement and positioning in six degrees of freedom Funded as IND58
SRT-i08 Multi-sensor metrology for microparts in innovative industrial products Funded as IND59
SRT-i09 Sustainable electrical machines and devices with reduced rare earth content Not funded
SRT-i10 Improved EMC test methods in industrial environments Funded as IND60
SRT-i11 Metrology for optical and RF communication systems Funded as IND51
SRT-i12 Metrology for industrial flow metering Not funded
SRT-i13 Metrology for processing materials with high natural radioactivity Funded as IND57
SRT-i14 Development of novel non-destructive evaluation techniques and procedures for defect detection in composite structures Not funded
SRT-i15 Metrology to enable high temperature erosion testing Funded as IND61
SRT-i16 Novel electronic devices based on control of strain at the nanoscale Funded as IND54
SRT-i17 Metrology for airborne molecular contamination in manufacturing environments Funded as IND63
SRT-i18 Metrology to support bioprocessing quality-by-design Not funded
SRT-i19 Nanoscale probing of transport across interfaces Not funded
SRT-i20 Sustainable components through combining plasticity size effects Not funded
SRT-i21 Multidimensional reflectometry for industry Funded as IND52
SRT-i22 Wavefont metrology for the characterisation of optical systems in industry Not funded
SRT-i23 Metrology for surface waves and surface state-assisted devices Not funded
SRT-i24 Compact microwave clocks for industrial applications Funded as IND55

Selected Research Topics (SRTs) for EMRP Call 2012 - SI Broader Scope

SRT Number SRT Title Result
SRT-s01 Realisation, dissemination and application of the unit watt in airborne sound Funded as SIB56
SRT-s02 Optical standards for the traceable characterisation of dynamic pressure fields Not funded
SRT-s03 Quantum resistance metrology based on graphene Funded as SIB51
SRT-s04 Traceable metrology for high frequency power in the millimetre-wave range Not funded
SRT-s05 A quantum standard for sampled electrical measurements Funded as SIB59
SRT-s06 Metrology for new electrical measurement quantities in high-frequency circuits Funded as SIB62
SRT-s07 Automated impedance metrology extending the quantum toolbox for electricity Funded as SIB53
SRT-s08 Traceability of gas flow measurements for special applications Not funded
SRT-s09 Metrology for long distance surveying Funded as SIB60
SRT-s10 Angle metrology Funded as SIB58
SRT-s11 Optical bidirectional measurements Not funded
SRT-s12 Crystalline and self-assembled structures as length standards Funded as SIB61
SRT-s13 Outgassing rate control and pascal realisation in the extremely low-pressure range Not funded
SRT-s14 Force traceability within the meganewton range Funded as SIB63
SRT-s15 Traceable small force metrology Not funded
SRT-s16 Metrology for organic chemical calibrators Not funded
SRT-s17 Traceability for biologically relevant molecules and entities Funded as SIB54
SRT-s18 Traceable camera-based photometry and radiometry Not funded
SRT-s19 New primary standards and traceability for radiometry Funded as SIB57
SRT-s20 International timescales with optical clocks Funded as SIB55
SRT-s21 Metrology for thermal protection materials Funded as SIB52
SRT-s22 Thermophysical metrology at the micro and nano scale Not funded
SRT-s23 Metrology for moisture in materials Funded as SIB64

Selected Research Topics (SRTs) for EMRP Call 2012 - Open Excellence

SRT Number SRT Title Result
SRT-x1 Spintronics and spin-caloritronics in magnetic nanosystems Funded as EXL04
SRT-x2 Solid-state single quantum particle metrology Not funded
SRT-x3 Measurement and control of single-photon microwave radiation on a chip Funded as EXL03
SRT-x4 Nanoscale magnetic detection close to the quantum limit Not funded
SRT-x5 Quantum optomechanics and quantum enhanced ultra-high precision measurements Not funded
SRT-x6 Quantum engineered states for optical clocks and atomic sensors Funded as EXL01
SRT-x7 Single-photon sources for quantum technologies Funded as EXL02
SRT-x8 Advanced microscopy for multiparametric molecular imaging Not funded