EMRP Call 2012 - Industry, SI Broader Scope & Open Excellence

The aim of this call was to advance measurement science and technology by providing funding for Joint Research Projects (JRPs) and associated Researcher Grants in the fields of Metrology for Industry, SI Broader Scope and Open Excellence.

The industry projects use cutting-edge measurement science to drive innovation in industry and facilitate new products.They focus on new applications at the crossroads between different technologies to improve efficiency and effectiveness in high-tech industries and key industrial sectors, in order to ensure European industry remains globally competitive.

The second set SI Broader Scope projects continue to develop the SI system of measurement units. The projects focus on preparations for the implementation of the redefinition of the SI base units, which is likely to take place over the next few years, the development of practical realisations of the redefined units, and traceability of measurement results.

The Open Excellence projects are developing the measurement methods of the future through excellent science. The projects have no specific strategic theme but will bring together the best scientists in Europe to explore new techniques that have not yet been applied in measurement science. 

Metrology for SI Broader Scope

Project Number
Short Name
SIB51 GraphOhm Quantum resistance metrology based on graphene Franz Josef Ahlers (PTB)
SIB52 Thermo Metrology for thermal protection materials Jiyu Wu (NPL)
SIB53 AIM QuTE Automated impedance metrology extending the quantum toolbox for electricity Luis Palafox Gámir (PTB)
SIB54 Bio-SITrace Traceability for biologically relevant molecules and entities Helen Parkes (LGC)
SIB55 ITOC International timescales with optical clocks Helen Margolis (NPL)
SIB56 SoundPwr Realisation, dissemination and application of the unit watt in airborne sound Volker Wittstock (PTB)
SIB57 NEWSTAR New primary standards and traceability for radiometry Maria Luisa Rastello (INRIM)
SIB58 Angles Angle Metrology Tanfer Yandayan (UME)
SIB59 Q-WAVE A quantum standard for sampled electrical measurements Johannes Kohlmann (PTB)
SIB60 Surveying Metrology for long distance surveying Florian Pollinger (PTB)
SIB61 CRYSTAL Crystalline surfaces, self assembled structures, and nano-origami as length standards in (nano)metrology Ingo Busch (PTB)
SIB62 HFCircuits Metrology for new electrical measurement quantities in high-frequency circuits Nick Ridler (NPL)
SIB63 Force Force traceability within the meganewton range Rolf Kumme (PTB)
SIB64 METefnet Metrology for moisture in materials Martti Heinonen (MIKES)
  • 1
14 result(s)

Metrology for Open Excellence

Project Number
Short Name
EXL01 QESOCAS Quantum engineered states for optical clocks and atomic sensors Sebastien Bize (LNE-SYRTE)
EXL02 SIQUTE Single-photon sources for quantum technologies Stefan Kück (PTB)
EXL03 MICROPHOTON Measurement and control of single-photon microwave radiation on a chip Antti Manninen (MIKES)
EXL04 SpinCal Spintronics and spin-caloritronics in magnetic nanosystems Hans Werner Schumacher (PTB)
  • 1
4 result(s)

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