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EMRP Call 2012 - Industry, SI Broader Scope & Open Excellence
The aim of this call was to advance measurement science and technology by providing funding for Joint Research Projects (JRPs) and associated Researcher Grants in the fields of Metrology for Industry, SI Broader Scope and Open Excellence.
The industry projects use cutting-edge measurement science to drive innovation in industry and facilitate new products.They focus on new applications at the crossroads between different technologies to improve efficiency and effectiveness in high-tech industries and key industrial sectors, in order to ensure European industry remains globally competitive.
The second set SI Broader Scope projects continue to develop the SI system of measurement units. The projects focus on preparations for the implementation of the redefinition of the SI base units, which is likely to take place over the next few years, the development of practical realisations of the redefined units, and traceability of measurement results.
The Open Excellence projects are developing the measurement methods of the future through excellent science. The projects have no specific strategic theme but will bring together the best scientists in Europe to explore new techniques that have not yet been applied in measurement science.
Metrology for Industry
Metrology for SI Broader Scope
Metrology for Open Excellence
|Project Number||Short Name||Title||Coordinator|
|EXL01||QESOCAS||Quantum engineered states for optical clocks and atomic sensors||Sebastien Bize (LNE-SYRTE)|
|EXL02||SIQUTE||Single-photon sources for quantum technologies||Stefan Kück (PTB)|
|EXL03||MICROPHOTON||Measurement and control of single-photon microwave radiation on a chip||Antti Manninen (MIKES)|
|EXL04||SpinCal||Spintronics and spin-caloritronics in magnetic nanosystems||Hans Werner Schumacher (PTB)|
Download a brochure of the EMRP Call 2012 joint research projects in:
Visit EMRP Online to:
- apply for EMRP researcher grants
- find resources for those currently working on EMRP projects
- find in-depth call documentation
- read background information