EMRP Call 2010 - Industry & Environment

The aim of this call was to advance measurement science in the areas of Industry and the Environment.

The Industry projects support the development of measurement methods and techniques to improve traceability for industrial processes, focusing on enhancing existing technologies, while creating innovations and step changes within new technologies.

The Environment projects are improving data quality for policy making, underpinning environmental research activities and stimulating technological innovation.They focus on the local environmental level for air, water and soil pollution, and on the global level for challenges relating to climate change.

Metrology for Industry

Project Number
Short Name
Title
Coordinator
IND01 HiTeMS High temperature metrology for industrial applications (>1000 °C) Graham Machin (NPL)
IND02 EMINDA Electromagnetic characterisation of materials for industrial applications up to microwave frequencies Bob Clarke (NPL)
IND03 HighPRES High pressure metrology for industrial applications Wladimir Sabuga (PTB)
IND04 MetroMetal Ionising radiation metrology for the metallurgical industry Eduardo García-Toraño (CIEMAT)
IND05 MeProVisc Dynamic Mechanical Properties and Long-term Deformation Behaviour of Viscous Materials
IND06 MIQC Metrology for industrial quantum communication technologies Maria Luisa Rastello (INRIM)
IND07 Thin Films Metrology for the manufacturing of thin films Fernando Araujo de Castro (NPL)
IND08 MetMags Metrology for Advanced Industrial Magnetics Hans Werner Schumacher (PTB)
IND09 Dynamic Traceable Dynamic Measurement of Mechanical Quantities Thomas Bruns (PTB)
IND10 Form Optical and tactile metrology for absolute form characterisation Michael Schulz (PTB)
IND11 MADES Metrology to Assess the Durability and Function of Engineered Surfaces Mark Gee (NPL)
IND12 Vacuum Vacuum metrology for production environments Karl Jousten (PTB)
IND13 T3D Thermal design and time-dependent dimensional drift behaviour of sensors, materials and structures Jens Flügge (PTB)
IND14 Frequency New generation of frequency standards for industry Patrick Gill (NPL)
IND15 SurfChem Traceable quantitative surface chemical analysis for industrial applications Wolfgang Unger (BAM)
IND16 Ultrafast Metrology for ultrafast electronics and high-speed communications Mark Bieler (PTB)
IND17 Scatterometry Metrology of small structures for the manufacturing of electronic and optical devices Bernd Bodermann (PTB)
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17 result(s)

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