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Forbes, A., Jagan, K., Donlevy, J. and Eichstädt, S. (Physikalisch-Technische Bundesanstalt, Berlin, Germany)

Geršak, G., Schiebl, M., Nawotka, M., Jugo, E., Ferreira, M. do C., Duffy, A., Rosu, D.M., Pavlasek, P. (Slovak Institute of Metrology), Sedlák, V. and Pražák, D.

Sedlák, V., Pražák, D., Schiebl, M., Nawotka, M., Jugo, E., Ferreira, M. do C., Duffy, A., Rosu, D.M., Pavlasek, P. (Slovak Institute of Metrology) and Geršak, G.

Hui, S.C.N., Mikkelsen, M., Zöllner, H.J., Ahluwalia, V., Alcauter, S., Baltusis, L., Barany, D.A., Barlow, L.R., Becker, R., Berman, J.I., Berrington, A., Bhattacharyya, P.K., Blicher, J.U., Bogner, W., Brown, M.S., Calhoun, V.D., Castillo, R., Cecil, K.M., Choi, Y.B., Chu, W.C.W., Clarke, W.T., Craven, A.R., Cuypers, K., Dacko, M., de la Fuente-Sandoval, C., Desmond, P., Domagalik, A., Dumont, J., Duncan, N.W., Dydak, U., Dyke, K., Edmondson, D.A., Ende, G., Ersland, L., Evans, C.J., Fermin, A.S.R., Ferretti, A., Fillmer, A., Gong, T., Greenhouse, I., Grist, J.T., Gu, M., Harris, A.D., Hat, K., Heba, S., Heckova, E., Hegarty, J.P., Heise, K-F., Honda, S., Jacobson, A., Jansen, J.F.A., Jenkins, C.W., Johnston, S.J., Juchem, C., Kangarlu, A., Kerr, A.B., Landheer, K., Lange, T., Lee, P., Levendovszky, S.R., Limperopoulos, C., Liu, F., Lloyd, W., Lythgoe, D.J., Machizawa, M.G., MacMillan, E.L., Maddock, R.J., Manzhurtsev, A.V., Martinez-Gudino, M.L., Miller, J.J., Mirzakhanian, H., Moreno-Ortega, M., Mullins, P.G., Nakajima, S., Near, J., Noeske, R., Nordhøy, W., Oeltzschner, G., Osorio-Duran, R., Otaduy, M.C.G., Pasaye, E.H., Peeters, R., Peltier, S.J., Pilatus, U., Polomac, N., Porges, E.C., Pradhan, S., Prisciandaro, J.J., Puts, N.A., Rae, C.D., Reyes-Madrigal, F., Roberts, T.P.L., Robertson, C.E., Rosenberg, J.T., Rotaru, D-G., O'Gorman Tuura, R.L., Saleh, M.G., Sandberg, K., Sangill, R., Schembri, K., Schrantee, A., Semenova, N.A., Singel, D., Sitnikov, R., Smith, J., Song, Y., Stark, C., Stoffers, D., Swinnen, S.P., Tain, R., Tanase, C., Tapper, S., Tegenthoff, M., Thiel, T., Thioux, M., Truong, P., van Dijk, P., Vella, N., Vidyasagar, R., Vovk, A., Wang, G., Westlye, L.T., Wilbur, T.K., Willoughby, W.R., Wilson, M., Wittsack, H-J., Woods, A.J., Wu, Y-C., Xu, J., Lopez, M.Y., Yeung, D.K.W., Zhao, Q., Zhou, X., Zupan, G. and Edden, R.A.E.

Tang, M., Schäffer, S.A., Jørgensen, A.A., Henriksen, M.R., Christensen, B.T.R., Müller, J.H. and Thomsen, J.W.

Edler, F., Bojkovski, J. (LMK, Ljubljana, Slovenia), Garcia Izquerdo, C., Jose Martin, M., Tucker, D., Arifovic, N. (TUBITAK, Turkey), Andersen, S.L., Šindelárová, L. and Žužek, V. (LMK, Ljubljana, Slovenia)

Fuchs, P., Jung, T., Kieschnick, M., Meijer, J. and Becher, C.

Tran-Gia, J., Denis-Bacelar, A.M., Ferreira, K.M., Robinson, A.P., Calvert, N., Fenwick, A.J., Finocchiaro, D., Fioroni, F., Grassi, E., Heetun, W., Jewitt, S.J., Kotzassarlidou, M., Ljungberg, M., McGowan, D.R., Scott, N., Scuffham, J., Gleisner, K.S., Tipping, J., Wevrett, J., Bardiès, M., Berenato, S., Bilas, I., Bobin, C. (LNE-LNHB), Capogni, M. (Instituto Nazionale di Metrologia delle Radiazioni Ionizzante, ENEA, C.R. Casaccia, P.O. Box 2400, I-00100 Rome, Italy), Chauvin, M., COLLINS, S., Cox, M. (NPL), Dabin, J., D’Arienzo, M., Gustafsson, J., Hallam, A., Kalathas, T., Kayal, G., Lorusso, G., Maringer, F-J., Morgan, D., Smyth, V. (National Physical Laboratory NPL, Hampton Road, Teddington, Middlesex, TW11 0LW, UK), Solc, J., Štemberková, L., Struelens, L., Vergara-Gil, A., Wiedner, H. and Lassmann, M.

Nissilä, J., Fordell, T., Kohopää, K., Mykkänen, E., Immonen, P. (VTT, Finland), Jabdaraghi, R.N., Bardalen, E. (HBV), Kieler, O., Karlsen, B., Øhlckers, P.A., Behr, R., Manninen, A.J. (VTT, Finland), Govenius, J. and Kemppinen, A.

Amer, E., Wozniak, M., Jönsson, G. and Arrhén, F. (SP Technical Research Institute of Sweden, Boras, Sweden)

Cox, M. (NPL), Jagan, K. and Rajan, S.

Gačnik, J., Živković, I., Ribeiro Guevara, S., Jaćimović, R., Kotnik, J. and Horvat, M.