The Influence of Source Impedance in Electrical Characterization of Solid State Lighting Sources
Zhao D., Rietveld G.Document type | Proceedings |
Journal title / Source | Proceedings of CPEM 2012: Conference on Precision Electromagnetic Measurements |
Publication date | 2012 |
Conference name | CPEM 2012: Conference on Precision Electromagnetic Measurements |
Conference date | 1 - 6 July 2012 |
Conference place | Washington, DC, USA |
ISSN | 0589-1485 |
DOI | 10.1109/CPEM.2012.6250921 |
Web URL | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6250921 |