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Infrared spectrometric measurement of impurities in highly enriched ‘Si28’

Zakel, S., Wundrack, S., Niemann, H., Rienitz, O. and Schiel, D.
Keywords:

Infrared spectrometric measurement, Silicon, Avogadro constant

Document typeArticle
Journal title / SourceMetrologia
Volume48
Issue2
Publication date 2011
DOI10.1088/0026-1394/48/2/S02
LanguageEnglish

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