Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode
Yacoot Andrew, Rerucha Simon, Pham Tuan M, Cizek Martin, Hucl Vaclav, Číp Ondřej, Lazar Josefoptical metrology, DBR laser diode, frequency stabilization, laser interferometry, dimensional metrology, iodine stabilization, displacement measurement
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Volume | 28 |
| Issue | 4 |
| Page numbers / Article number | 045204 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Temple Circus,Temple Way, Bristol, BS1 6BE, United Kingdom |
| Publication date | 2017-2-16 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/aa5ab9 |
| Language | English |