Temperature dependence mitigation in stationary Fourier-transform on-chip spectrometers

Herrero-Bermello A., Velasco A.V., Podmore H., Cheben P., Schmid J.H., Janz S., Calvo M.L., Xu D.X, Scott A., Corredera P.
Keywords:

temperature, silicon on insulator, microspectrometer

Document type Article
Journal title / Source Optics Letters
Volume 42
Issue 11
Page numbers / Article number 2239
Publisher's name The Optical Society
Publication date 2017-6
ISSN 0146-9592, 1539-4794
DOI 10.1364/OL.42.002239
Web URL https://digital.csic.es/handle/10261/164048
Language English

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