Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies

Wu W., Ridler N., Shang X., Ma D.
Keywords:

Data filtering, dielectric constant, loss tangent, millimeter-wave measurements, time-domain gating, vector network analyzer (VNA)

Document type Article
Journal title / Source IEEE Transactions on Instrumentation and Measurement
Volume 70
Issue N/A
Page numbers / Article number 6005904
Publisher's name IEEE
Publication date 2021-3-18
ISSN 1557-9662
DOI 10.1109/TIM.2021.3067224
Language English

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