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Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies

Wu, W., Ridler, N. (National Physical Laboratory, Teddington, United Kingdom), Shang, X. and Ma, D.
Keywords:

Data filtering, dielectric constant, loss tangent, millimeter-wave measurements, time-domain gating, vector network analyzer (VNA)

Document typeArticle
Journal title / SourceIEEE Transactions on Instrumentation and Measurement
Volume70
IssueN/A
Page numbers / Article number6005904
Publisher's nameIEEE
Publication date 2021-03-18
ISSN1557-9662
DOI10.1109/TIM.2021.3067224
LanguageEnglish

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