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Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Wang, Y., Shang, X., Ridler, N.M. (NPL, National Physical Laboratory, Teddington, United Kingdom), Huang, T. and Wu, W.
Keywords:

Dielectric constant, dielectric measurements, free-space measurement, loss tangent, millimeter-wave measurements, vector network analyzer (VNA)

Document typeArticle
Journal title / SourceIEEE Transactions on Instrumentation and Measurement
Volume69
Issue7
Page numbers / Article number4930-4939
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publication date 2020-07
ISSN0018-9456, 1557-9662
DOI10.1109/TIM.2019.2954010
LanguageEnglish

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