Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Wang Y., Shang X., Ridler N.M., Huang T., Wu W.
Keywords:

Dielectric constant, dielectric measurements, free-space measurement, loss tangent, millimeter-wave measurements, vector network analyzer (VNA)

Document type Article
Journal title / Source IEEE Transactions on Instrumentation and Measurement
Volume 69
Issue 7
Page numbers / Article number 4930-4939
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2020-7
ISSN 0018-9456, 1557-9662
DOI 10.1109/TIM.2019.2954010
Language English

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