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VNA tools II: Calibrations involving eigenvalue problems

Wollensack, M., Hoffmann, J., Stalder, D., Ruefenacht, J. and Hoffmann, J.
Keywords:

Vector Network Analyzer, S-parameters, Calibration, Uncertainty, Traceability

Document typeProceeding
Journal title / Source2017 89th ARFTG Microwave Measurement Conference (ARFTG)
Volume1
Issue1
Page numbers / Article number1-4
Publisher's nameIEEE
Publication date 2017-06
Conference nameWollensack, Michael, et al.
Conference date09-06-2017 to 10-06-2017
Conference placeHonolulu
DOI10.7795/EMPIR.14IND02.CA.20190404
ISBN978-1-5386-2748-8
Web URLhttp://dx.doi.org/10.1109/ARFTG.2017.8000832
LanguageEnglish

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