Microfocusing at the PG1 beamline at FLASH
Weigelt H., Siewert F., Rübhausen M., Reininger R., Mey T., Goderich R., Gerasimova N., Dziarzhytski S., Yandayan T.synchrotron optics; X-ray optics; metrology for synchrotron optics; slope measurement; NOM; multilayer; focusing mirrors
Document type | Article |
Journal title / Source | Journal of Synchrotron Radiation |
Volume | 23 |
Issue | 1 |
Page numbers / Article number | 123-131 |
Publisher's name | International Union of Crystallography (IUCr) |
Publication date | 2016-1 |
ISSN | 1600-5775 |
DOI | 10.1107/S1600577515023127 |
Language | English |