Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration

Wang Yi, Shang Xiaobang, Ridler Nick M., Naftaly Mira, Dimitriadis Alexandros I., Huang Tongde, Wu Wen
Keywords:

Loss tangent, millimeter-wave measurements, relative permittivity, terahertz measurements, time-domain spectrometer (TDS), thru-reflect-line (TRL) calibration, vector network analyzer (VNA)

Document type Article
Journal title / Source IEEE Transactions on Terahertz Science and Technology
Volume 10
Issue 5
Page numbers / Article number 466-473
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2020-9
ISSN 2156-342X, 2156-3446
DOI 10.1109/TTHZ.2020.2999631
Language English

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