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Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration

Wang, Yi, Shang, Xiaobang, Ridler, Nick M., Naftaly, Mira, Dimitriadis, Alexandros I., Huang, Tongde and Wu, Wen

Loss tangent, millimeter-wave measurements, relative permittivity, terahertz measurements, time-domain spectrometer (TDS), thru-reflect-line (TRL) calibration, vector network analyzer (VNA)

Document typeArticle
Journal title / SourceIEEE Transactions on Terahertz Science and Technology
Page numbers / Article number466-473
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publication date 2020-09
ISSN2156-342X, 2156-3446

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