High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes
Wain, A. J., Pollard, A. J. and Richter, C.SECM, AFM, Scanning Probe Microscopy, Topography, Graphene, Graphite, Electroactivity
| Document type | Article |
| Journal title / Source | Analytical Chemistry |
| Volume | 86 |
| Publication date | 2014-04-28 |
| DOI | 10.1021/ac500946v |