High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes
Wain A. J., Pollard A. J., Richter C.SECM, AFM, Scanning Probe Microscopy, Topography, Graphene, Graphite, Electroactivity
Document type | Article |
Journal title / Source | Analytical Chemistry |
Volume | 86 |
Publication date | 2014-4-28 |
DOI | 10.1021/ac500946v |