A new compact soft x-ray spectrometer for resonant inelastic x-ray scattering studies at PETRA III
Viefhaus J., Nordgren J., Siewert F., Reininger R., Hage A., Agåker M., Hahn U., Peters H. B., Yin Z., Yandayan Tanfersynchrotron optics; X-ray optics; metrology for synchrotron optics; slope measurement; NOM; multilayer; focusing mirrors
Document type | Article |
Journal title / Source | Review of Scientific Instruments |
Volume | 86 |
Issue | 9 |
Page numbers / Article number | 093109 |
Publisher's name | AIP Publishing |
Publication date | 2015-9 |
ISSN | 0034-6748, 1089-7623 |
DOI | 10.1063/1.4930968 |
Language | English |