Electrons on a straight path: A novel ionisation vacuum gauge suitable as reference standard
Vicar M., Jönnson G., Jenninger B., Illgen C., Bundaleski N., Jousten K., Boineau F., Bernien M., Šetina J., Teodoro O.Ionisation vacuum gaugeHot cathodeSensitivitySecondary electronsIon induced secondary electron yield
| Document type | Article |
| Journal title / Source | VACUUM |
| Volume | 189 |
| Issue | 2021 |
| Page numbers / Article number | 110239 |
| Publisher's name | Elsevier Ltd |
| Publication date | 2021 |
| ISSN | 0042-207X |
| DOI | 10.1016/j.vacuum.2021.110239 |
| Web URL | https://arxiv.org/abs/2103.03566 |
| Language | English |