Influence of Sampling Voltmeter Parameters on RMS Measurements of Josephson Stepwise-Approximated Sine Waves
van den Brom H. E., Houtzager E., Verhoeckx S., Martina Q. E., Rietveld G.AC Josephson voltage standards; binary Josephson arrays; measurement standards; sampling voltmeter; voltage measurement
Document type | Article |
Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
Volume | 58 |
Issue | 10 |
Page numbers / Article number | 3806-3812 |
Publication date | 2009 |
ISSN | 0018-9456 |