Hong-Ou-Mandel interferometry on a biphoton beat note

Chen Y., Fink M., Steinlechner F., Torres J.P., Ursin R.
Keywords:

quantum metrology, Hong-Ou-Mandel

Document type Article
Journal title / Source npj Quantum Information
Volume 5
Issue 1
Publisher's name Springer Science and Business Media LLC
Publication date 2019-5-24
ISSN 2056-6387
DOI 10.1038/s41534-019-0161-z
Language English

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