Hong-Ou-Mandel interferometry on a biphoton beat note
Chen Y., Fink M., Steinlechner F., Torres J.P., Ursin R.quantum metrology, Hong-Ou-Mandel
Document type | Article |
Journal title / Source | npj Quantum Information |
Volume | 5 |
Issue | 1 |
Publisher's name | Springer Science and Business Media LLC |
Publication date | 2019-5-24 |
ISSN | 2056-6387 |
DOI | 10.1038/s41534-019-0161-z |
Language | English |