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Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements

Weiss, T.P., Bissig, B., Feurer, T., Carron, R., Buecheler, S. and Tiwari, A.N.
Keywords:

thin filmsemiconductor

Document typeArticle
Journal title / SourceScientific Reports
Volume9
Issue1
Publisher's nameSpringer Nature
Publication date 2019-03-29
ISSN2045-2322
DOI10.1038/s41598-019-41716-x
LanguageEnglish

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