Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements
Weiss T.P., Bissig B., Feurer T., Carron R., Buecheler S., Tiwari A.N.thin filmsemiconductor
Document type | Article |
Journal title / Source | Scientific Reports |
Volume | 9 |
Issue | 1 |
Publisher's name | Springer Nature |
Publication date | 2019-3-29 |
ISSN | 2045-2322 |
DOI | 10.1038/s41598-019-41716-x |
Language | English |