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SENSITIVITY ANALYSIS ON THE EFFECT OF MEASUREMENT NOISE AND SAMPLING FREQUENCY ON THE CALCULATION OF THE TEMPORAL LIGHT ARTEFACTS

Thorseth, A., Lindén, J. and Bouroussis, C.A.
Keywords:

Photometry, Temporal light modulation, TLM, Temporal light artefacts, TLA, Flicker, Measurement uncertainty, Propagation of uncertainty.

Document typeProceeding
Journal title / SourceProceedings of the Conference CIE 2021
Volumex48
Page numbers / Article numberOP28
Publisher's nameInternational Commission on Illumination, CIE
Publication date 2021-12
Conference nameCIE 2021 Midterm Meeting & Conference
Conference date27-09-2021 to 29-09-2021
Conference placeKuala Lumpur, Malaysia
DOI10.25039/x48.2021.OP28
Web URLhttps://orbit.dtu.dk/en/publications/sensitivity-analysis-on-the-effect-of-measurement-noise-and-sampl
LanguageEnglish

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