Calibration of X-ray computed tomography for surface topography measurement using metrological characteristics
Thompson A., Rodríguez-Sánchez Á., Senin N., Eifler M., Hering J., Leach R.Metrology, surface topography, metrological characteristics, X-ray computed tomography
Document type | Proceedings |
Journal title / Source | Proceedings 21st euspen International Conference and Exhibition |
Publication date | 2021-6-10 |
Conference name | 21st euspen International Conference and Exhibition |
Conference date | 07-06-2021 to 10-06-2021 |
Conference place | Online Conference |
Language | English |
Persistent Identifier | https://www.euspen.eu/knowledge-base/ICE21165.pdf |