Calibration of X-ray computed tomography for surface topography measurement using metrological characteristics

Thompson A., Rodríguez-Sánchez Á., Senin N., Eifler M., Hering J., Leach R.
Keywords:

Metrology, surface topography, metrological characteristics, X-ray computed tomography

Document type Proceedings
Journal title / Source Proceedings 21st euspen International Conference and Exhibition
Publication date 2021-6-10
Conference name 21st euspen International Conference and Exhibition
Conference date 07-06-2021 to 10-06-2021
Conference place Online Conference
Language English
Persistent Identifier https://www.euspen.eu/knowledge-base/ICE21165.pdf

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