In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes

Teir L., Lindstedt T., Widmaier T., Hemming B., Brand U., Fahrbach M., Peiner E., Lassila A.
Keywords:

silicon microprobe, high speed, roughness, paper machine roll, metrology

Document type Article
Journal title / Source Sensors
Volume 21
Issue 17
Page numbers / Article number 5955
Publisher's name MDPI AG
Publication date 2021-9
ISSN 1424-8220
DOI 10.3390/s21175955
Language English

Back to the list view