In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes
Teir L., Lindstedt T., Widmaier T., Hemming B., Brand U., Fahrbach M., Peiner E., Lassila A.silicon microprobe, high speed, roughness, paper machine roll, metrology
Document type | Article |
Journal title / Source | Sensors |
Volume | 21 |
Issue | 17 |
Page numbers / Article number | 5955 |
Publisher's name | MDPI AG |
Publication date | 2021-9 |
ISSN | 1424-8220 |
DOI | 10.3390/s21175955 |
Language | English |