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Use of a nanocrystalline core for a precise non-invasive AC current measurement

Styblikova, R. (Czech Metrology Institute), Knenicky, M, Hlavacek, J. (Czech Technical University in Prague), Prochazka, R. and Draxler, K. (Czech Metrology Institute)
Keywords:

AC current sensor, nanocrystalline material, non-invasive measurement, phase displacement, ratio error.

Document typeProceeding
Journal title / Source2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
Publisher's nameIEEE
Publication date 2016-07
Conference name2016 Conference on Precision Electromagnetic Measurements
Conference date10-07-2016 to 15-07-2016
Conference placeOttawa, ON, Canada
ISSN2160-0171
DOI10.1109/CPEM.2016.7540492
ISBN978-1-4673-9134-4
LanguageEnglish

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