Use of a nanocrystalline core for a precise non-invasive AC current measurement
Styblikova, R. (Czech Metrology Institute), Knenicky, M, Hlavacek, J. (Czech Technical University in Prague), Prochazka, R. and Draxler, K. (Czech Metrology Institute)AC current sensor, nanocrystalline material, non-invasive measurement, phase displacement, ratio error.
| Document type | Proceeding |
| Journal title / Source | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
| Publisher's name | IEEE |
| Publication date | 2016-07 |
| Conference name | 2016 Conference on Precision Electromagnetic Measurements |
| Conference date | 10-07-2016 to 15-07-2016 |
| Conference place | Ottawa, ON, Canada |
| ISSN | 2160-0171 |
| DOI | 10.1109/CPEM.2016.7540492 |
| ISBN | 978-1-4673-9134-4 |
| Language | English |