Electrical Homogeneity Mapping of Epitaxial Graphene on Silicon Carbide
Whelan P.R., Panchal V., Petersen D.H., Mackenzie D.M.A., Melios C., Pasternak I., Gallop J., Østerberg F.W., U. Jepsen P., Strupinski W., Kazakova O., Bøggild P.conductivity; graphene; metrology; micro four-point probe; SiC; terahertz spectroscopy
| Document type | Article |
| Journal title / Source | ACS Applied Materials & Interfaces |
| Volume | 10 |
| Issue | 37 |
| Page numbers / Article number | 31641-31647 |
| Publisher's name | American Chemical Society (ACS) |
| Publication date | 2018-8-21 |
| ISSN | 1944-8244, 1944-8252 |
| DOI | 10.1021/acsami.8b11428 |
| Web URL | https://pubs.acs.org/doi/10.1021/acsami.8b11428 |
| Language | English |