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Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction

Galatro, Luca and Spirito, Marco
Keywords:

Calibration, characteristic impedance, measurement, millimeter wave, silicon, TRL, vector network analyzer (VNA)

Document typeArticle
Journal title / SourceIEEE Transactions on Microwave Theory and Techniques
Volume65
Issue4
Page numbers / Article number9
Publisher's nameIEEE
Publisher's address (city only)Piscataway
Publication date 2017-04
ISSN0018-9480
DOI10.1109/TMTT.2016.2609413
Web URLhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7837598
LanguageEnglish

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