Uncertainty Analysis in the Measurement of Switching Losses in GaN FETs Power Converters
Silva F., Pous M., Azpurua M.A.-
Document type | Proceedings |
Journal title / Source | 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) |
Volume | 2020 |
Issue | - |
Page numbers / Article number | 1-6 |
Publisher's name | IEEE |
Publication date | 2020-5 |
Conference name | 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) |
Conference date | 25-05-2020 to 28-05-2020 |
Conference place | Dubrovnik, Croatia |
ISSN | Electronic ISSN: 2642-2077 |
ISBN | Electronic ISBN: 978-1-7281-44 |
Web URL | https://ieeexplore.ieee.org/document/9129552 |
Language | English |
Persistent Identifier | http://hdl.handle.net/2117/328678 |