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Uncertainty Analysis in the Measurement of Switching Losses in GaN FETs Power Converters

Silva, F. (UPC barcelona), Pous, M. and Azpurua, M.A.
Keywords:

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Document typeProceeding
Journal title / Source2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Volume2020
Issue-
Page numbers / Article number1-6
Publisher's nameIEEE
Publication date 2020-05
Conference name2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Conference date25-05-2020 to 28-05-2020
Conference placeDubrovnik, Croatia
ISSNElectronic ISSN: 2642-2077
ISBNElectronic ISBN: 978-1-7281-44
Web URLhttps://ieeexplore.ieee.org/document/9129552
LanguageEnglish
Persistent Identifierhttp://hdl.handle.net/2117/328678

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