Reliable mmWave On-Wafer Measurement from Lab to Factory Floor

Shang X., Ridler N., Tucker A., Williams T.

on-wafer measurement, introductory guide, reliable, mmwave, planar circuits, s-parameters, knowledge transfer, metrology labs, NPL, Filtronic, PlanarMet, PlanarCal, User Guide, EMPIR

Document type Article
Journal title / Source Microwaves & RF
Volume Test & Mea
Issue April 2022
Page numbers / Article number 1-5
Publisher's name Microwave & RF
Publication date 2022-4
ISSN 7452993
Language English
Persistent Identifier mmwave-onwafer-measurement-from-lab-to-factory-floor

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