Reliable mmWave On-Wafer Measurement from Lab to Factory Floor

Shang X., Ridler N., Tucker A., Williams T.
Keywords:

on-wafer measurement, introductory guide, reliable, mmwave, planar circuits, s-parameters, knowledge transfer, metrology labs, NPL, Filtronic, PlanarMet, PlanarCal, User Guide, EMPIR

Document type Article
Journal title / Source Microwaves & RF
Volume Test & Mea
Issue April 2022
Page numbers / Article number 1-5
Publisher's name Microwave & RF
Publication date 2022-4
ISSN 7452993
Web URL https://www.mwrf.com/technologies/test-measurement/document/21237918/reliable-mmwave-onwafer-measurement-from-lab-to-factory-floor-download
Language English
Persistent Identifier https://www.mwrf.com/technologies/test-measurement/article/21237915/filtronicreliable- mmwave-onwafer-measurement-from-lab-to-factory-floor

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