Reducing the statistical and systematic uncertainty of the VTT MIKES 88Sr+ ion clock

Seppäläinen L.
Keywords:

metrology, atomic clocks, optical clocks, simulation, SI second, ion trap

Document type Thesis
Journal title / Source
University name Aalto University
Publisher's name Aalto University
Publication date 2021-12-14
Language English
Persistent Identifier http://urn.fi/URN:NBN:fi:aalto-2021121910848

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