Improved Just-Before-Test Verification Methods with VNA for Conducted EMC Tests

Şen O., Çakır S.
Keywords:

Conducted Emission, Conducted Immunity, EMC, Verification

Document type Proceedings
Journal title / Source 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)
Page numbers / Article number 1-6
Publisher's name IEEE
Publisher's address (city only) Piscataway, USA
Publication date 2018-8-30
Conference name 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)
Conference date 27-08-2018 to 30-08-2018
Conference place Amsterdam, The Netherlands
ISSN 2325-0364
DOI 10.1109/EMCEurope.2018.8485179
ISBN 978-1-4673-9698-1
Web URL http://rfmw.cmi.cz/documents/papers/Sen_EMCEurope2018OA.pdf
Language English

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