Improved Just-Before-Test Verification Methods with VNA for Conducted EMC Tests
Şen O., Çakır S.Conducted Emission, Conducted Immunity, EMC, Verification
Document type | Proceedings |
Journal title / Source | 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) |
Page numbers / Article number | 1-6 |
Publisher's name | IEEE |
Publisher's address (city only) | Piscataway, USA |
Publication date | 2018-8-30 |
Conference name | 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) |
Conference date | 27-08-2018 to 30-08-2018 |
Conference place | Amsterdam, The Netherlands |
ISSN | 2325-0364 |
DOI | 10.1109/EMCEurope.2018.8485179 |
ISBN | 978-1-4673-9698-1 |
Web URL | http://rfmw.cmi.cz/documents/papers/Sen_EMCEurope2018OA.pdf |
Language | English |