Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz
Schmuckle Franz-Josef, Heinrich Wolfgang, Probst Thorsten, Arz Uwe, Zinal Sherko, Hechtfischer Gerdon-wafer, calibration, S-parameters, traceability,uncertainty budget
Document type | Proceedings |
Journal title / Source | 2017 90th ARFTG Microwave Measurement Symposium (ARFTG) |
Publisher's name | IEEE |
Publication date | 2017-11-30 |
Conference name | ARFTG Microwave Measurement Symposium |
Conference date | 28-11-2017 to 01-12-2017 |
Conference place | Boulder, Colorado |
DOI | 10.7795/EMPIR.14IND02.CA.20190403 |
ISBN | 978-1-5386-4356-3 |
Web URL | https://doi.org/10.1109/ARFTG.2017.8255874 |
Language | English |