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Bringing real-time traceability to high-speed atomic force microscopy

Heaps, E., Yacoot, A., Dongmo, H., Picco, L., Payton, O.D. (University of Bristol, Bristol, UK), Russell-Pavier, F.S and Klapetek, P (Czech Metrology Institute (CMI), Brno , Okruzni 31, 638 00, Czech Republic)
Keywords:

Metrology, high-speed atomic force microscopy, traceability, nanometrology, nanotechnology

Document typeArticle
Journal title / SourceMeasurement Science and Technology
Publisher's nameIOP Publishing
Publication date 2020-03
ISSN0957-0233, 1361-6501
DOI10.1088/1361-6501/ab7ca9
LanguageEnglish

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