Improving resolution-sensitivity trade off in sub-shot noise quantum imaging
Ruo-Berchera I., Meda A., Losero E., Avella A., Samantaray N., Genovese M.Optical metrology, Quantum correlations, Signal processing, Quantum efficiency, Quantum limit, Charge coupled devices
| Document type | Article |
| Journal title / Source | Applied Physics Letters |
| Volume | 116 |
| Issue | 21 |
| Page numbers / Article number | 214001 |
| Publisher's name | AIP Publishing |
| Publication date | 2020-5-26 |
| ISSN | 0003-6951, 1077-3118 |
| DOI | 10.1063/5.0009538 |
| Language | English |