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Improving resolution-sensitivity trade off in sub-shot noise quantum imaging

Ruo-Berchera, I., Meda, A., Losero, E., Avella, A., Samantaray, N. and Genovese, M.
Keywords:

Optical metrology, Quantum correlations, Signal processing, Quantum efficiency, Quantum limit, Charge coupled devices

Document typeArticle
Journal title / SourceApplied Physics Letters
Volume116
Issue21
Page numbers / Article number214001
Publisher's nameAIP Publishing
Publication date 2020-05-26
ISSN0003-6951, 1077-3118
DOI10.1063/5.0009538
LanguageEnglish

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