Improving resolution-sensitivity trade off in sub-shot noise quantum imaging
Ruo-Berchera I., Meda A., Losero E., Avella A., Samantaray N., Genovese M.Optical metrology, Quantum correlations, Signal processing, Quantum efficiency, Quantum limit, Charge coupled devices
Document type | Article |
Journal title / Source | Applied Physics Letters |
Volume | 116 |
Issue | 21 |
Page numbers / Article number | 214001 |
Publisher's name | AIP Publishing |
Publication date | 2020-5-26 |
ISSN | 0003-6951, 1077-3118 |
DOI | 10.1063/5.0009538 |
Language | English |