Improving resolution-sensitivity trade off in sub-shot noise quantum imaging

Ruo-Berchera I., Meda A., Losero E., Avella A., Samantaray N., Genovese M.

Optical metrology, Quantum correlations, Signal processing, Quantum efficiency, Quantum limit, Charge coupled devices

Document type Article
Journal title / Source Applied Physics Letters
Volume 116
Issue 21
Page numbers / Article number 214001
Publisher's name AIP Publishing
Publication date 2020-5-26
ISSN 0003-6951, 1077-3118
DOI 10.1063/5.0009538
Language English

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