Enhancing the sensitivity of nano-FTIR spectroscopy
Hermann P. (DPM), Kästner B., Hoehl A. (DPM), Kashcheyevs V., Patoka P. (BEV), Ulrich G. (BEV), Feikes J., Ries M., Tydecks T., Beckhoff B., Ruhl E. (BEV), Ulm G.Instrumentation, measurement, and metrology; Near-field microscopy
Document type | Article |
Journal title / Source | Optics Express |
Volume | 25 |
Issue | 14 |
Page numbers / Article number | 16574 |
Publisher's name | The Optical Society |
Publication date | 2017-7 |
ISSN | 1094-4087 |
DOI | 10.1364/OE.25.016574 |
Web URL | https://www.osapublishing.org/DirectPDFAccess/158D237A-A0E8-5960-84426107CE1CBCF4_369006/oe-25-14-16574.pdf?da=1&id=369006&seq=0&mobile=no |
Language | English |